A Unified Flicker Noise Model for FDSOI MOSFETs Including Back-bias Effect

Journal
2018 IEEE International Conference on Electronics, Computing and Communication Technologies, CONECCT 2018
Date Issued
2018-10-04
Author(s)
Kushwaha, Pragya
Dabhi, Chetan Kumar
Lin, Yen Kai
Duarte, J. P.
Hu, Chenming
Chauhan, Yogesh Singh