Robust Compact Model of High-Voltage MOSFET's Drift Region

Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Date Issued
2023-01-01
Author(s)
Pahwa, Girish
Sharma, Ayushi
Goel, Ravi
Gill, Garima
Chauhan, Yogesh Singh
Hu, Chenming
Subjects