Modeling of GeOI and validation with Ge-CMOS inverter circuit using BSIM-IMG industry standard model

Journal
2016 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2016
Date Issued
2016-12-15
Author(s)
Kushwaha, Pragya
Chauhan, Yogesh S.
Khandelwal, Sourabh
Duarte, Juan P.
Lin, Yen Kai
Chang, Huan Lin
Hu, Chenming
Wu, Heng
Ye, Peide D.
Subjects