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Scholarly Output
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Effect of Temperature Induced Phase Variation in ALD TiO<inf>2</inf>Dielectric on the Switching Behaviour of RRAM Devices
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Effect of Temperature Induced Phase Variation in ALD TiO<inf>2</inf>Dielectric on the Switching Behaviour of RRAM Devices
Journal
2022 IEEE International Conference on Emerging Electronics, ICEE 2022
Date Issued
2022-01-01
Author(s)
Dwivedi, Anurag
Saini, Shalu
Lodhi, Anil
Agarwal, Harshit
Tiwari, Shree Prakash
Subjects
emerging memory devic...