Modeling of Induced Gate Thermal Noise Including Back-Bias Effect in FDSOI MOSFET

Journal
IEEE Microwave and Wireless Components Letters
Date Issued
2018-07-01
Author(s)
Dabhi, Chetan Kumar
Dasgupta, Avirup
Kushwaha, Pragya
Hu, Chenming
Chauhan, Yogesh Singh
Subjects