Erratum: Growth of residual stress-free ZnO films on SiO<inf>2</inf>/Si substrate at room temperature for MEMS devices (AIP Advances (2015) 5 (067140))

Date Issued
2015-07-01
Author(s)
Singh, Jitendra
Ranwa, Sapana
Akhtar, Jamil
DOI
10.1063/1.4926425