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Effect of Gamma Ray Irradiation on Epitaxial Pb(Zr,Ti)O<inf>3</inf> /SrRuO<inf>3</inf> Tunable Varactor Devices
ISSN
03615235
Date Issued
2016-08-01
Author(s)
Barala, Surendra Singh
Banerjee, Nirupam
Kumar, Mahesh
DOI
10.1007/s11664-016-4655-6
Abstract
Epitaxial morphotropic PbZr0.52Ti0.48O3 (PZT) thin films were employed to enhance the dielectric tunability of microwave filter devices without compromising the device impedance matching and low bias voltage (<10 V) requirements. Epitaxial heterostructure of ferroelectric PZT(001)/SrRuO3 (SRO) were grown on single crystal SrTiO3 (001) substrates by pulsed laser deposition, and a platinum (Pt) electrode was deposited on top of the PZT film. The tunability of the Pt/PZT/SRO varactor devices are strongly dependent on bias voltage and exhibited good dielectric tunability of 55% at 100 kHz and 10 V. The capacitance (CP) of the heteroepitaxial varactor devices was 105 pF at 10 V applied bias with a corresponding small leakage current of 1 nA. The influence of gamma (γ-ray) irradiation on the intrinsic electrical properties of the epitaxial PZT varactor devices was investigated as a function of the irradiation dose from 0 kGy to 400 kGy, in terms of the capacitance–voltage (C–V) characteristics and loss tangent response. With enhancing γ-ray irradiation doses the ferroelectric capacitance was found to decrease accompanying degradation in the loss tangent values. The results indicate that tunability of the epitaxial PZT ferroelectric thin-film capacitors decreased with increasing gamma irradiation dose and degraded ∼25% at 400 kGy dose than unexposed devices. Possible reasons for the degradation behavior of dielectric properties and tunability due to radiation-induced defects has been discussed.